FORMULA® HF3 platform test systems come in two models – FORMULA®HF3 and FORMULA® HF3 512 – and are designed for functional testing of a wide range of high-speed VLSI circuits: microcontrollers; static and dynamic memory; masterslice VLSI circuits; ASICs, FPGA and others with up to 256/512 signal outputs and operating frequency up to 200 MHz. The FORMULA® HF3 Test System is an ATE for functional and parametric testing of ultrahigh frequency VLSI circuits. The applications for FORMULA® HF3 are quality control of VLSI circuits, testing and studies of newly developed types of VLSI circuits, and production monitoring for serial products. The FORMULA® HF3 meets the requirements of metrological standards in measurement and testing in microelectronics. The key technical characteristics of the test systems are defined by the following values: • Number of universal bidirectional pins – up to 512; • Functional test frequency – up to 200 MHz per pin.