The FORMULA® TT2 test system is a universal testing and measuring system designed for comprehensive automated verification of the static parameters of semiconductor devices: field effect and bipolar transistors, diodes, thyristors, stabilizer diodes, optocouplers. The applications of the Test System are quality control of semiconductor devices when conducting tests and studies of newly developed types of semiconductor devices, and during in-production testing in series production. Basic technical characteristics and functional capabilities: Range of specified and measured voltage ±100 mV…±2000 V; Error in voltage setting and measurement from ±(0.5% + 10) mV; Current source and measure resources ±2 nA… ±100 А; Error in current setting and measurement from ±(0.4% + 400) pA; Pulse duration 300 μs ...100 s.