The FORMULA® HF Ultra Test System is an ATE for functional and parametric testing of ultrahigh frequency VLSI circuits. The applications for FORMULA® HF are quality control of VLSI circuits, testing and studies of newly developed types of VLSI circuits, and production monitoring for serial products. The FORMULA® HF Ultra meets the requirements of metrological standards in measurement and testing in microelectronics. The FORMULA® HF Ultra Test System was created for reliable measurement and testing of a wide range of VLSI circuits. The key technical characteristics of the ATE are - Number of universal bidirectional pins — up to 1024 - Functional testing frequency — up to 550 MHz per pin - Precision generator reference frequency — 1200 MHz - Vector/error memory — up to 128 М/128 М vectors - DAC/ADC measurement unit — 1200 MOPS/24 bit.