Cutting-edge Atomic Force Microscopy techniques for large and multiple samples. Ultimate imaging quality with build-in acoustic and vibration isolation, active thermostabilization, industry lowest 25 fm/√Hz optical beam deflection sensor noise and unique design of scanning-by-tip system allow routine high resolution imaging. Equipped with 50+ AFM modes including HybriDTM mode: all cutting-edge nanomechanical, electrical and magnetic studies are available in basic configuration. Automated study of samples arrays by user-defined scenario with database image storage. Up to 200×200 mm and 40 mm in height samples inspection in any point with 1 μm positioning accuracy. Smart ScanTronic™ software for one-click optimization of scanning parameters. This is not just an algorithm, it is rather a unique companion that helps a newcomers in AFM to get industry quality images and assists the experts. Wide possibilities of customization.