Versatile automated AFM-Raman, SNOM and TERS system NTEGRA Spectra II with the help of Tip Enhanced Raman Scattering (TERS) allows carrying out spectroscopy/microscopy with nanometer scale resolution. Specially prepared AFM probes (nanoantennas) can be used for TERS to enhance and localize light at the nanometer scale area near the tip apex. Such probes act as a "nano-source" of light giving possibility of optical imaging with resolution less than a diffraction limit (up to ~ 10 nm). SNOM allows to obtain optical and spectroscopy images of optically active samples with resolution limited by probe aperture size (~ 100 nm). Applications: Graphene, carbon nanotubes and other carbon materials; Semiconductor devices; Nanotubes, nanowires, quantum dots and other nanoscale materials; Polymers; Optical devices characterization: semiconductor lasers, optical fibers, waveguides, plasmonic devices; Cellular tissue, DNA, viruses and other biological objects; Chemical reaction control.